Photoinduced Defects in Semiconductors
Material type:
TextSeries: Cambridge studies in semiconductor physics and microelectronic engineering ; 4Publication details: New York; Cambridge University Press, 1996.Description: x,217p; ill. 24cmISBN: - 0521461960 (hc)
- 621.38 RED 1996
- QC611.6.D4 R43 1996
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Open Shelf
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MUST Main Library | 621.38152RED 1996 (Browse shelf(Opens below)) | Available | 2021-1366 |
Includes; bibliographical references (p. 201-214) and index.
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