000 01376cam a22003614a 4500
001 13087139
003 OSt
005 20241017105703.0
008 030210s2003 ne a 001 0 eng
010 _a 2003041860
020 _a0750676167 (pbk. : alk. paper)
035 _a(OCoLC)ocm51756099
040 _aDLC
_cmust
_dC#P
_dDLC
042 _apcc
050 0 0 _aTK7895.A8
_bB34 2003
082 0 0 _a621.3815 BAK 2003
_221
100 1 _aBaker, Mark.
_919272
245 1 0 _aDemystifying mixed-signal test methods /
_cMark Baker.
260 _aAmsterdam ;
_aBoston :
_bNewnes,
_cc2003.
300 _axii, 279 p. :
_bill. ;
_c24 cm.
490 1 _aDemystifying technology series
500 _aIncludes index.
650 0 _aAutomatic test equipment.
_919273
650 0 _aElectronic apparatus and appliances
_xTesting.
_919274
650 0 _aMixed signal circuits.
_919275
650 0 _aSignal generators.
_919276
830 0 _aDemystifying technology series (Amsterdam, Netherlands)
_919277
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/els051/2003041860.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/els051/2003041860.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2ddc
_cB_BANK
999 _c9449
_d9449